Wave Optics

 
Pleas use the tabs to display the product type (Experiments, Sets, Products or Lit./Softw.).
 

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Details

Product-No: P0750800

Diffraction at a grating

Principle

By carrying out this experiment using transmission gratings with largely differing grating constants, the students should gain an understanding of how these affect the interference pattern. Establishing the wavelength ? of light filtered with the ...

 
Details

Product-No: P1195900

Interference of light

Principle

By dividing up the wave-front of a beam of light at the Fresnel mirror and the Fresnel biprism, interference is produced. The wavelength is determined from the interference patterns.

Tasks

Determination of the wavelength of light by interferen ...

 
Details

Product-No: P2220100

Newton's rings with interference filters

Principle

In a Newton's rings apparatus, monochromatic light interferes in the thin film of air between the slightly convex lens and a plane glass plate. The wavelengths are determined from the radii of the interference rings.

Tasks

Using the Newton's r ...

 
Details

Product-No: P2220200

Newton's rings with optical base plate

Principle

The air wedge formed between slightly convex lens and a plane glass plate (Newton's colour glass) is used to cause interference of monochromatic light. The wavelength is determined from the radii of the interference rings.

Tasks

The diameters ...

 
Details

Product-No: P2220205

Structure of a Fresnel zone / zone plate

Principle

A zone plate is illuminated with parallel laser light. The focal points of several orders of the zone plate are projected on a ground glass screen.

Tasks

  1. The laser beam must be widened so that the zone plate is well illuminated. It must ...
 
Details

Product-No: P2220400

Coherence and width of spectral lines with the Michelson interferometer

Principle

The wavelengths and the corresponding lengths of coherence of the green spectral lines of an extreme high pressure Hg vapour lamp are determined by means of a Michelson interferometer. Different double slit combinations are illuminated to verify the coherence condit ...

 
Details

Product-No: P2220600

Refraction index of air and CO2 with the Michelson interferometer

Principle

A measurement cuvette set in the beam path of a Michelson interferometer can be evacuated or filled with CO2. The refraction indexes of air or CO2 are determined through the assessed modification of the interference pattern.

What you can learn abou ...

 
Details

Product-No: P2220700

Diffraction at a slit and Heisenberg's uncertainty principle

Principle

The distribution of intensity in the Fraunhofer diffraction pattern of a slit is measured. The results are evaluated both from the wave pattern view point, by comparison with Kirchhoff's diffraction formula, and from the quantum mechanics standpoint to confirm Heise ...

 
Details

Product-No: P2230100

Diffraction at a slit and Heisenberg's uncertainty principle

Principle

The intensity distribution in the Fraunhofer diffraction pattern of a slit is measured. Measurement results are evaluated both in the wave representation through comparison with Kirchhoff's diffraction fromula and in the photon representation, in orde ...

 
Details

Product-No: P2230105

Diffraction of light at a slit and an edge

Principle

Monochromatic light is incident on a slit or an edge. The intensity distribution of the diffraction pattern is determined.

Tasks

  1. Measurement of the width of a given slit.
  2. Measurement of the intensity distribution of t ...
 
Details

Product-No: P2230200

Diffraction of light at a slit and at an edge

Principle

Monochromatic light is incident on a slit or an edge. The intensity distribution of the diffraction pattern is determined.

Tasks

  1. Measurement of the width of a given slit.
  2. Measurement of the intens ...
 
Details

Product-No: P2230205

Intensity of diffractions due to pin hole diaphragms and circular obstacles

Principle

Pin hole diaphragms and circular obstacles are illuminated with laser light. The resulting intensity distributions due to diffraction are measured by means of a photo diode.

Tasks

  1. The complete intensity distribution of the diffr ...
 
Details

Product-No: P2230300

Diffraction intensity due to multiple slits and grids

Principle

Multiple slits which all have the same width and the same distance among each other, as well as transmission grids with different grid constants, are submitted to laser light. The corresponding diffraction patterns are measured according to their position and intens ...

 
Details

Product-No: P2230400

Diffraction intensity at slit and double slit systems

Principle

Slit and double slit systems are illuminated with laser light. The corresponding diffraction patterns are measured by means of a photodiode which can be shifted, as a function of location and intensity.

Tasks

  1. Determination of the ...
 
Details

Product-No: P2230500

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