Applied Mechanics

 
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Inherent fluorescence radiation of the X-ray energy detector

Principle

Fluorescence radiation of the elements of a sample can cause fluorescence radiation inside the detector and its housing if the energy is sufficiently high. As a result, the spectrum may include lines that are not caused by the sample. For the detectio ...

 
Details

Product-No: P2544201

Qualitative X-ray fluorescence spectroscopy of metalsMoseley's law

Principle

Various metal samples are subjected to polychromatic X-rays. The energy of the resulting fluorescence radiation is analysed with the aid of a semiconductor detector and a multi-channel analyser. The energy of the corresponding characteristic X-ray lin ...

 
Details

Product-No: P2544501

Qualitative X-ray fluorescence analysis of alloyed materials

Principle

The composition of various alloys is analysed with the aid of polychromatic X-rays. The energy of the characteristic fluorescence lines of the alloy constituents is analysed with the aid of a semiconductor de-tector and a multichannel analyser. The al ...

 
Details

Product-No: P2544601

Qualitative X-ray fluorescence analysis of powder samples

Principle

Various powder samples are subjected to polychromatic X-rays. The energy of the resulting fluorescence radiation is analysed with the aid of a semiconductor detector and a multichannel analyser. The energy of the corresponding characteristic X-ray flu ...

 
Details

Product-No: P2544701

Qualitative X-ray fluorescence analysis of solutions

Principle

Various saturated solutions are subjected to polychromatic X-rays. The energy of the resulting fluorescence radiation is analysed with the aid of a semiconductor  detector and a multi-channel analyser. The energy of the corresponding characteris ...

 
Details

Product-No: P2544801

Quantitative X-ray fluorescence analysis of alloyed materials

Principle

Various alloyed materials are subjected to polychromatic X-rays. The energy of the resulting fluorescence radiation is analysed with the aid of a semiconductor detector and a multichannel analyser. The energy of the corresponding characteristic X-ray ...

 
Details

Product-No: P2545001

Quantitative X-ray fluorescence analysis of solutions

Principle

Various solutions, with known element concentrations, are subjected to polychromatic X-rays. The energy and intensity of the resulting fluorescence radiation of the dissolved elements are analysed with the aid of a semiconductor detector and a multic ...

 
Details

Product-No: P2545101

X-ray fluorescence spectroscopy ? layer thickness determination

Principle

X-ray fluorescence analysis (XRF) is suitable for the non-contact and non-destructive thickness measurement of thin layers as well as for determining their chemical composition. For this type of measurement, the X-ray source and detector are located ...

 
Details

Product-No: P2545201

Compton effect - energy-dispersive direct measurement

Principle

Photons of the molybdenum K? X-ray line are scattered at th ...

 
Details

Product-No: P2546001

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X-ray expert unit

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