Non Destructive Testing (NDT)

16 Products, 32 Experiments, 6 Sets, 2 Lit./Softw.

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Experiments (32) Sets (6) Products (16) Literature/Software (2)

X-ray fluorescence spectroscopy ? layer thickness determination

Principle

X-ray fluorescence analysis (XRF) is suitable for the non-contact and non-destructive thickness measurement of thin layers as well as for determining their chemical composition. For this type of measurement, the X-ray source and detector are located ...

Details

Product-No: P2545201