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Diffraction at a slit and Heisenberg's uncertainty principle

Product No: P2230100

Principle

The distribution of intensity in the Fraunhofer diffraction pattern of a slit is measured. The results are evaluated both from the wave pattern view point, by comparison with Kirchhoff's diffraction formula, and from the quantum mechanics standpoint to confirm Heisenberg's uncertainty principle.

Tasks

To measure the intensity distribution of the Fraunhofer diffraction pattern of a single slit (e. g. 0.1 mm). The heights of the maxima and the positions of the maxima and minima are calculated according to Kirchhoff's diffraction formula and compared with the measured values.
To calculate the uncertainty of momentum from the diffraction patterns of single slits of differing widths and to confirm Heisenberg's uncertainty principle.

What you can learn about

Diffraction
Diffraction uncertainty
Kirchhoff's diffraction formula
Measurement accuracy
Uncertainty of location
Uncertainty of momentum
Wave-particle dualism
De Broglie relationship

Materiallist (Excerpt)	Product	Amount
Laser, He-Ne, 1.0 mW, 230 V AC	08181-93	1
Si-Photodetector with Amplifier	08735-00	1
Sliding device, horizontal	08713-00	1
Control Unit for Si-Photodetector	08735-99	1
Optical profile-bench, l 1500mm	08281-00	1
Diaphragm holder	08040-00	1
Digital multimeter 2010	07128-00	1
Slide mount for optical bench, h = 30 mm	08286-01	3
Base for optical bench, adjustable	08284-00	2
Diaphragm, 3 single slits	08522-00	1
Adapter, BNC-plug/socket 4 mm.	07542-26	1
Connecting cord, 32 A, 500 mm, red	07361-01	1
Connecting cord, 32 A, 500 mm, blue	07361-04	1
Laboratory Experiments Physics, Chemistry, Biology andApplied Sciences, CD-ROM, incl. operating manuals	16502-42	1