X-ray investigation of cubic crystal structures / Debye- Scherrer powder method

Product No: P2541401

Principle

When polycrystalline samples are irradiated with X-rays a characteristic diffraction pattern results. These Debye-Scherrer reflections are photographed and then evaluated.

Tasks

  1. Debye-Scherrer photographs are to be taken of powdered samples of sodium chloride and caesium chloride.
  2. The Debye-Scherrer rings are to be evaluated and assigned to the corresponding lattice planes.
  3. The lattice constants of the sample materials are to be determined.
  4. The number of atoms in the unit cells of each sample are to be determined.

What you can learn about

  • Crystal lattices
  • Crystal systems
  • Reciprocal lattice
  • Miller indices
  • Structure amplitude
  • Atomic form factor
  • Bragg scattering



Materiallist (Excerpt) Product Amount
XR 4.0 expert unit 09057-99 1
XR 4.0 X-ray Plug-in Mo tube 09057-60 1
XR 4.0 X-ray film holder 09057-08 1
XR 4.0 X-ray optical bench 09057-18 1
XR 4.0 X-ray films, wet chemical,100 pieces, 100 × 100 mm² 09058-23 1
XR 4.0 X-ray Diaphragm tube d = 1 mm 09057-01 1
Slide mount for optical bench, h = 30 mm 08286-01 1
XR 4.0 X-ray film developer, for4.5 l solution 06696-20 1
Sodium chloride 250 g 30155-25 1
XR 4.0 X-ray film fixing, for 4.5 l solution 06696-30 1
Caesium chloride 5 g 31171-02 1
Mortar w. pestle, 70ml, porcelain 32603-00 1
Vernier caliper, plastic 03011-00 1
Tray (PP), 180x240mm, white 47481-00 3
X-ray Bag for x-ray films, 10 pieces 09058-22 1
Microspoon, steel 33393-00 1
Laboratory Experiments Physics, Chemistry, Biology andApplied Sciences, CD-ROM, incl. operating manuals 16502-42 1

Literature for this article als follows

Title Product Language
TESS expert Physik Handbuch Experimente mit Röntgenstrahlung (XT) für die XR 4.0 expert unit 01200-01 DEU

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Product No: P2541401

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