Thin powder samples are subjected to polychromatic X-rays. The
energy of the radiation that passes through the samples is analysed
with the aid of a semiconductor detector and a multi-channel
analyser. The energy of the corresponding absorption edges is
determined and the resulting Moseley diagrams are used to determine
the Rydberg frequency, the screening constant and the principal
- Calibration of the semiconductor energy detector with the aid
of the characteristic radiation of the calibration sample.
- Recording of the energy spectra of the polychromatic X-rays
that pass through the powder samples.
- Determination of the energy of the corresponding K-
and L-absorption edges.
- Determination of the Rydberg frequency, screening constants,
and principal quantum numbers with the aid of the resulting Moseley
What you can learn about
- Characteristic X-radiation
- Absorption of X-rays
- Bohr's atom model
- Energy levels
- Moseley's law
- Rydberg frequency
- Screening constant
- Semiconductor energydetectors
- Multichannel analysers
Software included. Computer not provided.