Various metal samples are subjected to polychromatic X-rays. The
resulting fluorescence radiation is analysed with the aid of a
semiconductor detector and a multichannel analyser. The energy of
the characteristic X-ray lines and their full widths at half
maximum are determined. In addition, the dependence of the full
widths at half maximum and the shift of the line centroid as a
function of the counting rate are examined.
- Calibration of the semiconductor detector with the aid of the
characteristic radiation of the molybdenum X-ray tube.
- Recording of the spectra of the fluorescence radiation that is
generated by the metal samples.
- Determination of the energy levels and full widths at half
maximum of the characteristic Kα lines and their graphical
- Determination and graphical representation of the full widths
at half maximum as a function of the counting rate, with the Kα
line of zircon used as an example.
- Determination and graphical representation of the shift of the
line centroid as a function of the counting rate, with the Kα line
of zircon used as an example.
What you can learn about
- characteristic X-radiation
- fluorescence radiation
- conduction processes in semiconductors
- doping of semiconductors
- resolution and resolving power
- semiconductor energy
- multi-channel analysers