Principle
Fluorescence radiation of the elements of a sample can cause
fluorescence radiation inside the detector and its housing if the
energy is sufficiently high. As a result, the spectrum may include
lines that are not caused by the sample. For the detection of
potential additional lines, the detector is subjected to
monochromatic X-radiation with the aid of a monocrystal. For
comparison, the fluorescence spectra of pure metal samples are
measured.
Tasks
- Calibrate the semiconductor energy detector with the aid of the
characteristic fluorescence radiation of the calibration
sample.
- Irradiate the X-ray energy detector with monoenergetic X-rays
that are produced by the Bragg reflection on an LiF monocrystal.
Measure the resulting fluorescence spectrum.
- Determine of the energy of the spectrum lines.
- Assign the lines to elements by comparing the measured values
with table values.
- Comparative measurement and evaluation of the fluorescence
spectra of pure metal samples.
What you can learn about
- Bremsstrahlung
- Characteristic X-radiation
- Fluorescence radiation
- Fluorescent yield
- Interference of X-rays
- Crystal structures
- Bragg's law
- Compton scattering
- Escape peaks
- Semiconductor energy detectors
- Multichannel analysers
1 year warranty