Various metal samples are subjected to polychromatic X-rays. The
energy of the resulting fluorescence radiation is analysed with the
aid of a semiconductor detector and a multi channel analyser. The
energy of the corresponding characteristic X-ray lines is
determined and the resulting Moseley diagram is used to determine
the Rydberg frequency and the screening constants.
- Calibrate the semiconductor energy detector with the aid of the
characteristic radiation of the tungsten X-ray
- Record the spectra of the fluorescence radiation that are
generated by the metal samples.
- Determine the energy values of the corresponding characteristic
α- and K
- Determine the Rydberg frequency and screening constants with
the aid of the resulting Moseley diagrams.
What you can learn about
- characteristic X-radiation
- Absorption of X-rays
- Bohr's atom model
- Energy levels
- Moseley's law
- Rydberg frequency
- Screening constant
- Semiconductor energy detectors
- Multichannel analysers