Principle
Various metal samples are subjected to polychromatic X-rays. The
resulting fluorescence radiation is analysed with the aid of a
semiconductor detector and a multi-channel analyser. The maxima of
intensity of the corresponding characteristic X-ray lines are
determined. The predefined energy values of the characteristic
lines and channels of the multichannel analyser that must be
assigned in turn result in a calibration of the semiconductor
energy detector.
Tasks
- Record the spectra of the fluorescence radiation that is
generated by the metal samples.
- Determine the channel numbers of the maxima intensity of the
characteristic lines of the corresponding fluorescence
radiation.
- Represent the predefined line energies as a function of the
channel numbers graphically for two gain factors of the
multichannel analyser.
What you can learn about
- Bremsstrahlung
- Characteristic X-radiation
- Energy levels
- Fluorescence radiation
- Conduction processes in semiconductors
- Doping of semiconductors
- Pin-diodes
- Semiconductor energy detectors
- Multichannel analysers
1 year warranty