Product details

XR 4.0 X-ray Universal crystal holder for X-ray  unit

XR 4.0 X-ray Universal crystal holder for X-ray unit

Item no.: 09058-02

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  • Description
  • Related Experiments

Function and Applications

To be mounted on the goniometer of the x-ray unit for fixation of any type of flat probes (e.g. crystalls, foils) up to a thickness of 10 mm.

Benefits:

  • This holder allows the investigation of Debye-Scherrer lines - especially together with the powder probe holder- and material investigation.

Equipment and technical data:

  • Dimension H × W × D (mm): 42 × 20 × 42
  • Mass: 40 g
Experiment Item no.
Examination of the structure of NaCl monocrystals with different orientations P2541301
Debye-Scherrer diffraction patterns of powder samples with three cubic Bravais lattices P2542101
Debye-Scherrer diffractions pattern of powder samples with a diamond structure (according to Bragg-Brentano) P2542201
Debye-Scherrer diffraction patterns of powder samples with a hexagonal lattice structure P2542301
Debye-Scherrer diffraction patterns of powder samples with a tetragonal lattice structure P2542401
Debye-Scherrer diffraction patterns with a cubic powder sample P2542501
Diffraction measurements to determine the intensity of Debye-Scherrer reflexes using a cubic powder sample P2542601
Debye-Scherrer diffraction measurements for the examination of the texture of rolled sheets P2542701
X-ray energy spectroscopy - calibration of the X-ray energy detector P2544001
Energy resolution of the X-ray energy detector P2544101
Inherent fluorescence radiation of the X-ray energy detector P2544201
Qualitative X-ray fluorescence spectroscopy of metals - Moseley's law P2544501
Qualitative X-ray fluorescence analysis of alloyed materials P2544601
Qualitative X-ray fluorescence analysis of powder samples P2544701
Qualitative X-ray fluorescence analysis of solutions P2544801
Qualitative X-ray fluorescence analysis of ore samples P2544901
Quantitative X-ray fluorescence analysis of alloyed materials P2545001
Quantitative X-ray fluorescence analysis of solutions P2545101
X-ray fluorescence spectroscopy – layer thickness determination P2545201
Energy-dispersive measurements of K- and L-absorption edges P2546101
XR 4.0 X-ray system, complete set for all x-ray experiments 09057-88
XRS 4.0 X-ray structural analysis upgrade set 09140-88
XRM 4.0 Material Upgrade set 09160-88
XR 4.0 expert fundamental measurements set 09130-66
XR 4.0 expert special edition physical laws 09130-67

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