Cantilever, electrical conductive,10 pcs, for conductive AFM

Cantilever electrical measurement modes of the atomic force microscope (09700-99)

Equipment and Technical Data

• for electrical modes (EFM, Spreading resistance, Force modulation)
• Material: Si, monolithic
• Coating on both sides: electrical conductive (Pt/Cr)
• Holder chip: 3.4 x 1.6 x 0.3 mm, with alignment grooves
• Tip radius: less than 25nm
• Resonance Frequency: 75 kHz
• Spring constant: 3 N/m
• Length: 0.225mm
• Width: 0.028mm
• 10 pcs
• Weight: 0.04 kg