Technical data

X-ray investigation of crystal structures / Laue method with digital X-ray image sensor(XRIS)

Article no: P2541606

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Principle

Laue diagrams are produced when monocrystals are irradiated with polychromatic X-rays. This method is primarily used for the determination of crystal symmetries and the orientation of crystals. When a LiF monocrystal is irradiated with polychromatic X-rays, a characteristic diffraction pattern results. This pattern is photographed with the digital X-ray sensor XRIS.

Tasks

The Laue diffraction of an LiF monocrystal is to be recorded with the aid of the digital X-ray sensor.
The Miller indices of the corresponding crystal surfaces are to be assigned to the Laue reflections.

Learning objectives

Crystal lattices
Crystal systems
Crystal classes
Bravais lattice
Reciprocal lattice
Miller indices
Structure amplitude
Atomic form factor
The Bragg equation

Software included. Computer not provided.

Scope of delivery

XR 4.0 expert unit, 35 kV	09057-99	1
XR 4.0 X-ray Upgrade Set Computed Tomography	09185-88	1
XR 4.0 X-ray Plug-in with copper tube (Cu)	09057-51	1
XR 4.0 X-ray structural analysis upgrade set	09145-88	1