X-ray investigation of crystal structures / Laue method with digital X-ray image sensor(XRIS)

Principle

Laue diagrams are produced when monocrystals are irradiated with polychromatic X-rays. This method is primarily used for the determination of crystal symmetries and the orientation of crystals. When a LiF monocrystal is irradiated with polychromatic X-rays, a characteristic diffraction pattern results. This pattern is photographed with the digital X-ray sensor XRIS.

Tasks

1. The Laue diffraction of an LiF monocrystal is to be recorded with the aid of the digital X-ray sensor.
2. The Miller indices of the corresponding crystal surfaces are to be assigned to the Laue reflections.

Learning objectives

• Crystal lattices
• Crystal systems
• Crystal classes
• Bravais lattice
• Reciprocal lattice
• Miller indices
• Structure amplitude
• Atomic form factor
• The Bragg equation
  

Software included. Computer not provided.