Technical data

X-ray energy spectroscopy - calibration of the X-ray energy detector

Article no: P2544005

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Principle

Various metal samples are subjected to polychromatic X-rays. The resulting fluorescence radiation is analysed with the aid of a semiconductor detector and a multi-channel analyser. The maxima of intensity of the corresponding characteristic X-ray lines are determined. The predefined energy values of the characteristic lines and channels of the multichannel analyser that must be assigned in turn result in a calibration of the semiconductor energy detector.

Tasks

Record the spectra of the fluorescence radiation that is generated by the metal samples.
Determine the channel numbers of the maxima intensity of the characteristic lines of the corresponding fluorescence radiation.
Represent the predefined line energies as a function of the channel numbers graphically for two gain factors of the multichannel analyser.

Learning objectives

Bremsstrahlung
Characteristic X-radiation
Energy levels
Fluorescence radiation
Conduction processes in semiconductors
Doping of semiconductors
Pin-diodes
Semiconductor energy detectors
Multichannel analysers

Scope of delivery

XR 4.0 expert unit, 35 kV	09057-99	1
XR 4.0 X-ray goniometer	09057-10	1
XR 4.0 X-ray Plug-in with copper tube (Cu)	09057-51	1
XR 4.0 X-ray material upgrade set	09165-88	1