Technical data

Inherent fluorescence radiation of the X-ray energy detector

Article no: P2544205

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Principle

Fluorescence radiation of the elements of a sample can cause fluorescence radiation inside the detector and its housing if the energy is sufficiently high. As a result, the spectrum may include lines that are not caused by the sample. For the detection of potential additional lines, the detector is subjected to monochromatic X-radiation with the aid of a monocrystal. For comparison, the fluorescence spectra of pure metal samples are measured.

Tasks

Calibrate the semiconductor energy detector with the aid of the characteristic fluorescence radiation of the calibration sample.
Irradiate the X-ray energy detector with monoenergetic X-rays that are produced by the Bragg reflection on an LiF monocrystal. Measure the resulting fluorescence spectrum.
Determine of the energy of the spectrum lines.
Assign the lines to elements by comparing the measured values with table values.
Comparative measurement and evaluation of the fluorescence spectra of pure metal samples.

Learning objectives

Bremsstrahlung
Characteristic X-radiation
Fluorescence radiation
Fluorescent yield
Interference of X-rays
Crystal structures
Bragg's law
Compton scattering
Escape peaks
Semiconductor energy detectors
Multichannel analysers

Scope of delivery

XR 4.0 expert unit, 35 kV	09057-99	1
XR 4.0 X-ray goniometer	09057-10	1
XR 4.0 X-ray Plug-in with copper tube (Cu)	09057-51	1
XR 4.0 X-ray material upgrade set	09165-88	1