Technical data

Diffraction intensity at a slit and at a wire - Babinet's theorem

Article no: P2230601

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Principle

An aperture consisting of a single slit and a complementary strip (wire) is illuminated with a laser beam. The corresponding diffraction patterns are measured according to position and intensity with a photocell which can be shifted.

Benefits

surprisingly a slit and a wire show basically the same diffraction pattern
measurements prove a theorem that sounds awkward at first glance
sturdy setup allows good reproducability of results

Tasks

Determination of the intensity distribution of the diffraction patterns due to a slit and complementary strip (wire).
Determination of the intensity relations of the diffraction pattern peaks for the single slit.
Babinet's theorem is discussed using the diffraction patterns of the slit and the complementary strip.

Learning objectives

Huygens' principle
Interference
Fraunhofer und Fresnel diffraction
Babinet's theorem
Poissons' spot
Coherence
Laser

Scope of delivery

Diode pumped solid state laser, green, 1 mW, 532 nm	08765-99	1
Digital array camera	35612-99	1
Optical bench expert, l = 1500 mm	08281-00	1
Base for optical bench expert, adjustable	08284-00	2
Slide mount for optical bench expert, h = 30 mm	08286-01	3
Universal Holder, rotational	08040-02	1
Screen, with diffracting elements	08577-02	1