Compact AFM, Atomic Force Microscope

Function and Applications

Compact and easy-to-use atomic force microscope for imaging a wide range of micro- and nanostructures. Designed for teaching, laboratory courses, and research preparation in physics, chemistry, life sciences, and engineering.

Benefits

Compact all-in-one device, easy to operate and transport
Complete solution including instrument, samples, probes, tools, and experiment descriptions
Automatic probe approach to prevent damage to probe and sample
Samples are easy to insert and replace
No laser alignment required
Research-grade system at about one third of the cost of a research instrument

Technical Specification

Measurement modes: contact, dynamic, phase contrast, MFM, EFM, basic spectroscopy (force–distance, amplitude–distance, voltage–distance)
Scan head with integrated control on vibration-damped base plate, 21 × 21 × 18 cm (L × W × H)
Folding mechanism for sample and cantilever access with automatic switch-off of sample illumination and automatic retraction of the scan head; transparent protection against airflow and sound; USB 2.0 interface
Tip-scanner AFM: linear, electromagnetic, low voltage
Maximum scan area: 70 × 70 µm² (XY dimension, 10% manufacturing tolerance)
Maximum Z range: 14 µm
Resolution X/Y/Z: 1.1 nm
Z noise level (RMS static mode): 0.6 nm
Z noise level (RMS dynamic mode): 0.5 nm
Automatic approach: vertical, up to 4.5 mm
Holder for standard cantilevers from various manufacturers with alignment grooves
Top-view camera: USB, 2048 × 1536 pixels, resolution better than 2 µm, digital zoom 1×, 2×, 4×
White LED sample illumination with automatic switch-off
Expandable to additional modes via optional upgrade packages
Extended instrument control via scripting/user interface access (LabView, VisualBasic, …)
Cantilever set: 4× contact mode, 4× dynamic mode
Sample set (6): carbon nanotubes, CD stamp, chip structure, skin cross-section, microstructure, dried Staphylococcus bacteria
Four empty sample holders for user samples
Tool set for mounting samples and cantilevers
Powerful software for measurement, analysis, and visualization (1D, 2D, 3D)
Manual with detailed operating and software instructions and five fully described experiments
Power supply: 100–240 V, 50/60 Hz
Plastic case with compartments for upgrade packages and side camera, 44 × 32 × 25 cm